White Papers, Research Papers, Industry Articles

 A 28M 43cm2 full-frame CCD Imager for Medical and Scientific Applications (“Big is Beautiful”)
J. Bosiers, B. Dillen and L. Meessen
Presented at the International Image Sensors Workshop in May 2007

2.5 µm Pixel Linear CCD
Nixon O, Lei Wu, Melanie Ledgerwood, John Nam, Jonathan Huras
Presented at the International Image Sensors Workshop in May 2007

Analysis of Near-Field Diffraction Effects on CCD Resolution
D. Logan, S. McFaul, P.E. Jessop, A.P. Knights, M. Ledgerwood, N. O
Presented at the 13th Canadian Semiconductor Technology Conference in 2007

Random Telegraph Signal in CMOS Image Sensor Pixel.
Xinyang Wang, Padmakumar R. Rao, Adri Mierop*, Albert J.P. Theuwissen
Presented at IEDM 2006

“Technical challenges and recent progress in CCD imagers”
J. Bosiers, I. Peters, C. Draijer and A. Theuwissen
Nuclear Inst. and Methods in Physics Research, A, 2006 – Elsevier.

“28-M CCD imager with RGB compatible binning feature for professional applications”
I. Peters, C. Draijer, F. Polderdijk, L. Meessen, B. Dillen,  W. Klaassens, and J. Bosiers
Proceedings of SPIE, Volume 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, 2006

“Imagers for Professional Digital Photography”
J. Bosiers, B. Dillen, C. Draijer and I. Peters
ICIS '06, Rochester, New York; May 7, 2006

 “Featuring in CCD Imagers”
J. Bosiers, I. Peters andC. Draijer
2006 Proceedings of SPIE,  Volume 6196, Photonics in Multimedia, April  2006

“Imagers for digital still photography” (Invited paper)
J. Bosiers, B. Dillen, C. Draijer, E.-J. Manoury, L. Meessen and I. Peters
2006 Proceedings of SPIE,  Volume 6196, Photonics in Multimedia, April 2006

“Challenges and innovations in very-large CCD and CMOS imagers for professional imaging ” (invited paper)
J. Bosiers, H. Stoldt, W. Klaassensa, B. Dillena, I. Peters, E. Bogaart, R. Frost, L. Korthout, J. Timpert
2007 Proceedings of SPIE,  Volume 7001, Photonics in Multimedia, April  2006

“A 28 mega pixel large area full frame CCD with 2 x 2 on-chip RGB charge-binning for professional digital still imaging”
C.Draijer, F. Polderdijk, A. van der Heide, B.   Dillen, W. Klaassens and J. Bosiers
IEDM Technical Digest, Washington, D.C., Dec. 2005

“The hole role”
A. Theuwissen, J.   Bosiers, E. Roks
IEEE Electron Devices Meeting, 2005. IEDM Technical Digest, Washington, D.C., Dec. 2005

Design of a 148,680-pixel Ultrahigh-speed, High-sensitivity CCD
H.Ohtake, T.Hayashida, K.Kitamura, T.Arai, J.Yonai, H.Maruyama, K.Tanioka, T.G. Etoh, D. Poggemann, A. Ruckelshausen, H. van Kuijk and Jan T. Bosiers
CCD & AIS Workshop 2005, Karuizawa, Japan

Stitched mk x 96 7µm Pixel TDI Sensor
L. Wu, N. O, C. Draijer, J. Bosiers, H. van Kuijk and H. Stoldt
2005 CCD & AIS Workshop, Karuizawa, Japan

“A High-speed, High-sensitivity ½ Inch 1M-pixel Frame-Transfer CCD Imager for Medical and Industrial Applications”
A. Stravers-Cimpoiasua, Holger Stoldt, W. Klaassens, R. Frost and J. Bosiers
Proceedings of SPIE, Vol. 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI,  March 2005

Dark Current Reduction in FF-CCDs
I.  Peters, A. Kleimann, W. Klaassens, F. Polderdijk and J. Bosiers
2005 CCD & AIS Workshop, Karuizawa, Japan

Third Generation Large Area Professional DSC CCD Process and Design Technology
C. Draijer, W. Klaassens, H.L. Peek, H. Stoldt, B.Dillen and J. Bosiers
2005 CCD & AIS Workshop, Karuizawa, Japan

A 4M Pixel CMOS Image Sensor for High Speed Image Capture
P. Donegan, E. Fox, B. Li, M. Sonder, F. Feng, M. Kiik, S. Xie
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2005

12k 5 μm linescan CCD sensor with 320 MHz data rate
Brian Benwell, Nixon O, Gary Allan, Jonathan Huras, Melanie Ledgerwood
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2005

High Dynamic Range Data Centric Workflow System
Lucian Ion, Alan Lasky, John Coghill
Presented at the SMPTE Technical Conference and Exhibit, New York, November 2005

High Dynamic Range Workflow Considerations (slides).
John Coghill
Presented at the SMPTE Technical Conference and Exhibit, New York, November 2005

White Paper: Image Sensor Architectures for Digital Cinematography. 2005.

“Dark current reduction in very-large area CCD imagers for professional DSC applications”
I. Peters, A.  Kleimann, F. Polderdijk, W. Klaassens, R. Frost and J. Bosiers
IEDM Technical Digest, San Francsico, Dec. 2004

"Degradation Behavior and Mechanisms of CCD Image Sensor with Deep-UV Laser Radiation"
Flora M. Li, Nixon O, Arokia Nathan
IEEE Transactions on Electron Devices, Vol. 51, No. 12, December 2004

White Paper: 4K Digital Capture and Postproduction Workflow.
Lucian Ion and Neil Humphrey, 2004

 “A 35-mm format 11 M pixel full-frame CCD for professional digital still imaging”
J. Bosiers, B. Dillen, C. Draijer, A. Kleimann, F. Polderdijk, M de Wolf, W. Klaassens, A. Theuwissen, H. Peek and H.O. Folkerts
IEEE Transactions on Electron Devices,  vol. 50,  no. 1, Jan 2003

Design Considerations For large Area Professional DSC CCD Imager Output Amplifiers
C .Draijer, W. Klaassens, H. Peek, B. Dillen and J.Bosiers
2003 CCD & AIS Workshop, Elmau, Germany

Image Resolution of the One-CCD Palomar Motion Picture Camera
Charles Smith, Felicia Shu, Lucian Ion, Matthew Cowan
Presented at the 37th Advanced Motion Imaging Conference, 2003

CCD Detection of 157 nm Photons
Flora Li, Nixon O, and Arokia Nathan
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2003

248-nm UV Damage Mechanism in MPP CCDs
Nixon O, Jonathan Huras, Sukhbir Kullar, Saladin Sahinovic
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2003

"UV-Responsive CCD Image Sensors with Enhanced Inorganic Phospor Coatings"
Wendy A.R. Franks, Martin J. Kiik,and Arokia Nathan
This paper first appeared in IEEE Transactions on Electron Devices, Vol. 50, No. 2, Februrary 2003

“CCD imagers take new pixel approach for high-end applications”
Jan Bosiers, Holger Stoldt, Peter Hartog,  Wilco Klaassens  and Nixon O
Laser Focus World, April 2008

FPGAs improve vision processing
Kumara Ratnayake, DALSA
Test and Measurement World Magazine, December 2007

A visible cutting edge
Yvon Hubert, Comact Optimization
Control Design Magazine, December 2007

Machine Vision "sees" Color
Robert Howison, DALSA
Quality Magazine, November 2007

Vision systems checks for defective wine labels
Winn Hardin
Vision Systems Design, November 2007

How PCI Express is changing Machine Vision
Inder Kohli, DALSA
Embedded Technology Magazine, October 2007

On-track with machine vision: Machine vision facilitates speed, accuracy of textile inspection
Mark Hoske
Control Engineering Magazine, September 2007

Understanding Camera Performance Specs
Andrew Wilson, Editor
Vision Systems Design, July 2007

ROI processing offers opportunities
Mark Butler & Neil Humphrey, DALSA
Vision Systems Online, June 2007

Signing on for hazardous duty
Lee J. Nelson
Advanced Imaging Magazine, May 2007

PCI Express Powers Machine Vision
Inder Kohli, DALSA
Evaluation Engineering, May 2007

Emerging Trends in Machine Vision
Philip Colet, DALSA
Quality Magazine, Vision and Sensors special supplement, May 2007

Document Data Solutions helps its clients get their mail through
Philip Colet, DALSA
Photonics Online May 2007

Vision system advances wood inspection
Philip Colet, DALSA
EMVA, May 2007

High speed low light imaging: Escaping the shot noise limit
Nixon O. & Jonathan Huras, DALSA
Photonik International, May 2007

Digital Camera Technology for Today’s Industrial applications
Chris Brais & Mark Butler, DALSA
NASA Tech Briefs, Focus on video & imaging section, May 2007

Dual Linescan technology: Actively reducing the cost of LCDs
Mark Butler & Kenji Inoue, DALSA
EIZO Joho Industrial magazine, March 2007

The benefits of  machine vision for PCB test and inspection
Philip Colet, DALSA
CirCuiTree magazine, February 2007

Real-time, high speed image processing
Philip Colet, DALSA
Advanced Imaging, January 2007

Quality 101: Using machine vision
Brad Finney, DALSA
Quality magazine, January 2007